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High-resolution detection of small flaws and accurate thickness measurement in challenging components is solved by this TSTARC 4MHz Twin Crystal UT Probe. This dual element probe uses a separated crystal design to improve signal-to-noise ratio and enhance near-surface resolution. Supplier: Sonatest Ltd.
A 4 MHz Twin Crystal (TC) UT probe with a specialized design (TSTARC) for enhanced near-surface performance. It is used for high-resolution thickness gauging and corrosion/pitting detection on metallic surfaces. The probe is a high-detail, sharp-focus solution for precision near-surface NDT.
A 4MHz twin crystal (dual element) probe used for corrosion mapping and thickness gauging, offering improved near-surface resolution.
| Frequency: | 4 MHz |
| Element Type: | Twin Crystal (Dual Element) |
| Design: | Contoured/Focused Design (ARC for curved surfaces) |
Outside Diameter Shoe, Axial Array Wedge
It is a specialized Twin Crystal (Dual Element) probe designed for high-resolution inspection of materials, often used with Sonatest’s advanced flaw detectors.
**Errors and omissions excepted (E&OE)
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